Smotek accelerates the device prototyping process

The new zap­ping meth­od cuts the time to man­u­fac­ture test capa­cit­ors from nearly a month to just one week. The faster man­u­fac­tur­ing pro­cess enables Smol­tek’s research­ers to con­duct more exper­i­ments that accel­er­ate major tech­no­logy advances – mak­ing the CNF-MIM tech­no­logy more attract­ive to poten­tial buyers.

By cut­ting the devel­op­ment time so dra­mat­ic­ally, we can iter­ate faster and focus more on optim­iz­ing per­form­ance. This effi­ciency allows us to explore new con­fig­ur­a­tions and achieve break­throughs much soon­er, which strengthens our pos­i­tion when enga­ging with poten­tial buy­ers.

Far­z­an Ghavanini, CTO at Smoltek.

The new meth­od, called zap­ping, is exclus­ively used dur­ing the devel­op­ment phase to exped­ite test­ing. It enables research­ers to quickly eval­u­ate new con­fig­ur­a­tions and mater­i­als using sim­pli­fied test capa­cit­ors, sav­ing valu­able time and resources.

Zap­ping is a clear advant­age for us and our share­hold­ers. Faster devel­op­ment cycles mean short­er time to mar­ket for break­throughs, like trip­ling capa­cit­ance dens­ity and halv­ing leak­age current.

Far­z­an Ghavanini

Zap­ping, explained:
The zap­ping meth­od involves briefly apply­ing a high voltage across spe­cif­ic con­tact points on a test capa­cit­or, cre­at­ing a con­trolled break­down in the insu­lat­ing lay­er. This tech­nique elim­in­ates the need for mul­tiple com­plex etch­ing steps, sig­ni­fic­antly stream­lin­ing the test­ing process. 

For a more detailed explan­a­tion of the zap­ping meth­od and its impact on Smol­tek’s capa­cit­or tech­no­logy devel­op­ment, please vis­it the com­pany’s IR blog.